Joseph Dvorak

Assistant Physicist

Joseph Dvorak is a scientist in the Beamline Research and Development Section at NSLS. Part of his responsibilities include the characterization of the xray beam quality at the various beamlines, including ray tracing simulations. He is also involved in the implementation of the hard xray transmission microscopy at X8C.

His research interests involve using soft xray spectroscopy and scattering to study the electronic and structural properties of thin film and nanoparticle systems. He is also interested in the development of optics for the soft xray regime.

Professional Activities

Phone: 344-5135


  • Ph.D. 1998: Physical Chemistry, University of Pennsylvania
  • B.S. 1987: Chemistry, Pennsylvania State University


Key Publications

  • "J Dvorak, L Berman, S Hulbert, D Siddons, K Wallwork Simple Tools for Characterization of Synchrotron Beam Flux, Energy Resolution and Stability, SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Vol 1234, p. 645-648, sponsored by AIP (2009)."
  • "E Negusse, J Dvorak, J Holroyd, M Liberati, T Santos, J Moodera, E Arenholz, Y Idzerda Magnetic Characterization of Ultrathin EuO Films with XMCD. J. Appl. Phys., 105, 07C930 (2009)."
  • "J Dvorak, Y Idzerda, D Arena, Y Zhao, S Ogale, T Wu, T Venkatesan, R Godfrey, R Ramesh Are Strain-Induced Effects Truly Strain Induced? A Comprehensive Study of Strained LCMO Thin Films. J. Appl. Phys., 97, 10C102 (2005)."
  • "S Stadler, Y Idzerda, J Dvorak, J Borchers Using Circularly Polarized Soft X-rays to Probe antiferromagnetically correlated Co/Cu multilayers. J. Appl. Phys., 95(11), 6672 (2004)."
  • "J Dvorak, T Jirsak, J Rodriguez (2001)."

All Publications